Sample preparation equipment for SEM products available in Ibérica
PELCO® Precision Low Speed Saw
The PELCO® Precision Low Speed Saw is a compact, multipurpose, precision saw designed to cut a wide variety of materials with minimal subsurface damage. Its low speed makes it possible to cut fragile materials as well as soft materials that would load the diamond wheel on a higher speed saw.
PELCO® LatticeAx® 420
The PELCO® LatticeAx® 420 (formerly from LatticeGear™) provides the Highest level of Accuracy and Performance in the PELCO® LatticeAx® Indent and Cleaving System model lineup. The PELCO® LatticeAx® 420 delivers our highest cleaving accuracy of 10μm in less than 5 minutes making it ideal for any lab that values speed and high accuracy.
PELCO® Tripod Polisher™ 590TEM, 590SEM & 590TS
The PELCO® Tripod Polisher™ 590 was designed by researchers at IBM to accurately prepare TEM and SEM samples of pre-specified, micron-sized regions. For TEM samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed […]
PELCO® Precision Wire Saw™
The PELCO® Precision Wire Saw™ is capable of cutting a variety of materials while minimizing damage from the cutting process using a gentle lapping action. This gentle action combined with high precision and low kerf damage makes the Diamond Wire Saw ideal for slicing samples where minimizing mechanical damage and precise positioning of the cut are […]
Plasma Cleaner IBSS GV10x
Downstream Plasma Technology for Cleaning TEM Samples on Carbon Films
Carbon evaporator Quorum Q150T Plus series
For ultra-fine coatings in high vacuum applications.
Quorum K850 Critical Point Dryer
The Quorum K850 combines versatility and ease of operation with built-in thermo-electric heating and adiabatic cooling allow precise temperature control.
Quorum Q300T T Plus Series
Triple target sputter coater for specimens up to 200mm diameter
Quorum Q300T D Plus Series
Dual target sequential sputtering for specimens up to 150 mm diameter
Sputter coater standard&High resolution Quorum 150
Primary & Secondary vacuum metallizers
Cryo station for SEM and FIB quorum PP3010
For sensitive specimens on high resolution SEM
Hitachi Ion Polisher IM4000 II & ArBlade IM5000
The latest generation of Hitachi ion polishers are suitable for large surface preparation.
